Material Characterization

Material Characterization

Our Quality Control scientists have experience performing surface analysis and materials characterization for multiple studies and product types. Our expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you achieve successful results and reports.

From medical devices, to raw materials, to drug/device combinations, this analytical expertise can help you develop new processes and materials more efficiently, and transfer those processes to research and to production.

Analysis techniques are used simply to magnify the specimen, to visualize its internal structure, and to gain knowledge as to the distribution of elements within the specimen and their interactions.

Magnification and internal visualization are normally done in a type of microscope, such as:

• Optical Microscope
• Scanning Electron Microscope (SEM)
• Transmission Electron Microscope (TEM)
• Field Ion Microscope (FIM)
• Scanning Tunneling Microscope (STM)/ Scanning Probe Microscopy (SPM)
• Atomic Force Microscope (AFM)
• X-ray diffraction topography (XRT)

Elemental analysis of the specimen can also be done in a number of ways:

• Energy-Dispersive X-ray spectroscopy (EDX)
• Wavelength Dispersive X-ray spectroscopy (WDX)
• Mass spectrometry
• Impulse excitation technique (IET)
• Secondary Ion Mass Spectrometry (SIMS)
• Electron Energy Loss Spectroscopy (EELS)
• Auger electron spectroscopy
• X-ray photoelectron spectroscopy (XPS)
• ICP-MS : Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)

The state-of-the-art labs are staffed by some of the best trained and most experienced subject matter experts in the field.